11835 - Field-Emission Scanning Electron Microscope (FE-SEM)

The Department of Imaging Physics at TU Delft, Faculty of Applied Sciences, has available funding through the Dutch Research Council (NWO) Knowledge and Innovation Covenant (KIC) consortium “Foundations for Electron-Beam Metrology and Inspection” for the acquisition of advanced electron microscopy instrumentation. The intended purchase is a high-end field-emission scanning electron microscope (FE-SEM) to support coherent diffractive imaging in both transmission and reflection geometries.